This module includes the following functionality:

Topography Acquisition

With the Topography Tool you can acquire and inspect surfaces or surface structures of different sample types (e.g. water plates, solar cells). By the help of the Topography Measurement Wizard you can perform a confocal image acquisition of your sample. The advanced analysis of the topography image is performed by the help of the ConfoMap software which is included in the software package.

In the chapter Functions & Reference you find detailed functional descriptions of the Topography Tool and the Topography Measurement Wizard.

In the chapter Workflow Topography Acquisition you find a detailed how-to guide for topography acquisition, see Introduction.

Layer Thickness Measurement

With the Layer Thickness Measurement Tool you can acquire z-stacks and perform layer thickness measurements of one or more transparent layers (e.g. coatings, alloys). Here as well, the Layer Thickness Measurement Wizard will guide you through the process. The measured values can be corrected by the refractive index of the coating.

In the chapter Functions & Reference you find detailed functional descriptions of the Layer Thickness Measurement Tool and the Layer Thickness Measurement wizard.

In the chapter Workflow Layer Thickness Measurement you find a detailed how-to guide for layer thickness measurement, see Introduction.