Using this method the microscope image can be overlaid with different patterns, for example circles or parallel lines. The selected pattern can then be easily adjusted to fit the image. The intercept points with the grain boundaries will be recognized automatically. You can add or remove additional intercept points.

As the length of the pattern of lines is known, it is possible to determine the average grain size. This procedure corresponds to the requirements of the standard and the method is suitable for different kind of sample types. The analysis takes place in accordance with the following standards:

• ASTM E 112 - 13; 24
• ASTM E 1382 - 97 (2015)
• DIN EN ISO 643:2020; 2024
• GB/T 6394 - 2017

The default workflow (job template) of the method is described, see Grain Size Analysis (Intercept).